Noise characteristics and modeling of silicon-on-insulator insulated-gate pn-junction devices

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概要

• 論文の詳細を見る
• 関西大学の論文

著者

• Omura Yasuhisa

  Faculty Engineering Kansai University

• Omura Yasuhisa

  Faculty Engineering

• Wakita Shigeyuki

  High-Technology Research Center

関連論文

• Impact of transport noise enhancement in scaled-down MOSFET
• Noise characteristics and modeling of silicon-on-insulator insulated-gate pn-junction devices
• Reconsideration of Off-Leakage Current Estimation of Sub -100-nm SOI MOSFETs and Device Selection for Applications

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