Impact of transport noise enhancement in scaled-down MOSFET

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概要

• 論文の詳細を見る
• 関西大学の論文

著者

• Sumino Daijiro

  High-Technology Research Center, Kansai University

• Sumino Daijiro

  High-technology Research Center

• Omura Yasuhisa

  Faculty Engineering Kansai University

• Omura Yasuhisa

  Faculty Engineering

関連論文

• Theory of carrier-density-fluctuation-induced transport noise in metal-oxide-semiconductor field-effect transistors
• Impact of transport noise enhancement in scaled-down MOSFET
• Noise characteristics and modeling of silicon-on-insulator insulated-gate pn-junction devices
• Reconsideration of Off-Leakage Current Estimation of Sub -100-nm SOI MOSFETs and Device Selection for Applications
• Significant Impact of Transport Noise Enhancement in Scaled-Down MOSFET's

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