光学的三次元測定の研究

概要

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The recent development of various techniques in industry requires excellent three-dimensional measurements, one of which is noted as Moire topography. But usual method has some defects that a large grating is impposible to make and that some conditions prevent setting of the grating. Projecting the grating on which stripes are printed on an large object produces fringes and focusing them at another grating through an optical system yields Moire fringes meaning contour lines. And a new device suitable for more precise measurement is developed as two-point-projection method. For objects with profile of sharp inclination for which Moire topography is not profittable, obtaining contour lines by light cut method is tried with good results.
山梨大学の論文