Characterization of Semiconductor Heterojunction Electrodes

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概要

• 論文の詳細を見る
• 九州工業大学の論文
• 1981-03-00

著者

• Nogami Gyoichi

  Department Of Electrical Engineering Kyushu Institute Of Technology

• Nogami Gyoichi

  Department Of Electrical Engineering Kyushu Institute Of Tecgnology

関連論文

• The Internal Bias of Be-Doped Rochelle Salt
• 金電極の表面構造の二酸化炭素のパルス電解に及ぼす影響
• Switching Transients in Rochelle Salt
• Nucleation Model for Domain Wall Motion in Rochelle Salt
• Thermal Switching Due to a Local Inhomo-Geneity Existing Between the Electrode and the Amorphous Semiconductor
• Characterization of Semiconductor Heterojunction Electrodes

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