A novel 5DOF thin coplanar nanometer-scale stage
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概要
- 論文の詳細を見る
- 2008-10-01
著者
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Jywe Wen-Yuh
Institute of Mechanical and Electro-Mechanical Engineering, National Formosa University
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Liu Chien-Hung
Institute of Electro-Optical and Materials Science, National Formosa University
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Teng Yun-Feng
Department of Mechanical Engineering, National Chung-Cheng University
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Teng Yun-feng
Department Of Mechanical Engineering National Chung-cheng University
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Jywe Wen-yuh
Institute Of Mechanical And Electro-mechanical Engineering National Formosa University
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Liu Chien-hung
Institute Of Electro-optical And Materials Science National Formosa University
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Chen Yi-jou
Department Of Automation Engineering National Formosa University
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JYWE Wen-Yuh
Department of Automation Engineering, National Formosa University
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JENG Yeau-Ren
Institute of Mechanical Engineering, National Chung Cheng University
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TENG Yun-Feng
Institute of Mechanical Engineering, National Chung Cheng University
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WU Chia-Hung
Department of Mechanical Engineering, National Cheng Kung University
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WANG Hung-Shu
Department of Mechanical Engineering, National Cheng Kung University
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Jeng Yeau-ren
Institute Of Mechanical Engineering National Chung Cheng University
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Wang Hung-shu
Department Of Mechanical Engineering National Cheng Kung University
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Wu Chia-hung
Department Of Mechanical Engineering National Cheng Kung University
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Jywe Wen-yuh
Department Of Automation Engineering National Formosa University
関連論文
- C37 Development for a simple measurement system for pick-and-place mechanisms(Evaluation of machine tool performance)
- A novel 5DOF thin coplanar nanometer-scale stage
- Precision tracking control of a piezoelectric-actuated system