Assessment of GaN Surface Pretreatment for Atomic Layer Deposited High-k Dielectrics
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概要
- 論文の詳細を見る
- 2011-05-25
著者
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Eddy Charles
Electronics Science And Technology Division U.s. Naval Research Laboratory
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Meyer David
Electronics Science And Technology Division U.s. Naval Research Laboratory
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Garces Nelson
Global Strategies Group
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NEPAL Neeraj
Electronics Science and Technology Division, U.S. Naval Research Laboratory
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HITE Jennifer
Electronics Science and Technology Division, U.S. Naval Research Laboratory
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MASTRO Michael
Electronics Science and Technology Division, U.S. Naval Research Laboratory
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Nepal Neeraj
Electronics Science And Technology Division U.s. Naval Research Laboratory
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Hite Jennifer
Electronics Science And Technology Division U.s. Naval Research Laboratory
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Mastro Michael
Electronics Science And Technology Division U.s. Naval Research Laboratory
関連論文
- Assessment of GaN Surface Pretreatment for Atomic Layer Deposited High-k Dielectrics
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