Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling
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概要
- 論文の詳細を見る
- 2008-12-01
著者
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Holmestad Randi
Department Of Physics Norwegian University Of Science And Technology
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EBERG Espen
Department of Electronics and Telecommunications, Norwegian University of Science and Technology
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MONSEN Asmund
Department of Physics, Norwegian University of Science and Technology
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TYBELL Thomas
Department of Electronics and Telecommunications, Norwegian University of Science and Technology
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VAN HELVOORT
Department of Physics, Norwegian University of Science and Technology
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Eberg Espen
Department Of Electronics And Telecommunications Norwegian University Of Science And Technology
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Van Helvoort
Department Of Physics Norwegian University Of Science And Technology
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Monsen Asmund
Department Of Physics Norwegian University Of Science And Technology
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Tybell Thomas
Department Of Electronics And Telecommunications Norwegian University Of Science And Technology
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