A new approach to lattice parameter measurements using dynamic electron diffraction and pattern matching
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1998-04-01
著者
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Kim Miyoung
Department Of Physics And Astronomy Arizona State University
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ZUO J.
Department of Physics and Astronomy, Arizona State University
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HOLMESTAD Randi
Department of Physics, Norwegian University of Science and Technology
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Holmestad Randi
Department Of Physics Norwegian University Of Science And Technology
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Zuo J.
Department Of Physics And Astronomy Arizona State University
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Zuo J.M.
Department of Physics and Astronomy, Arizona State University
関連論文
- Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling
- A new approach to lattice parameter measurements using dynamic electron diffraction and pattern matching
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