Quick Response of All Solid Electrochromic Device

概要

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We fabricated all solid electrochromic devices by connecting two kinds of cyanide thin films. We found that the magnitude of $t_{\text{R}}$ decreases with increase in the electric pressure $|V|$ as $t_{\text{R}}\propto |V|^{-1}$ and with decrease in the device thickness $d_{\text{D}}$ as $t_{\text{R}}\propto (d_{\text{D}}-2d_{\text{EDL}})^{2}$, where $d_{\text{EDL}}$ ($=50{\mbox{--}}100$ nm) is the effective thickness of the electric double layer (EDL). These observations are well understood in terms of the leaked electric pressure from the EDL region, perhaps originated in the imperfect screening of $V$.
Japan Society of Applied Physicsの論文
2009-10-25