Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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Fogel Keith
Ibm Thomas J Watson Research Center
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REZNICEK Alexander
IBM Thomas J Watson Research Center
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BEDELL Stephen
IBM Thomas J Watson Research Center
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DE SOUZA
IBM Thomas J Watson Research Center
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SCHWARZ Klaus
IBM Thomas J Watson Research Center
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OTT John
IBM Thomas J Watson Research Center
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HOVEL Harold
IBM Thomas J Watson Research Center
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SADANA Devendra
IBM Thomas J Watson Research Center
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Ott John
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Sadana Devendra
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Bedell Stephen
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
関連論文
- Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium
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- Vertical Light-Emitting Diode Fabrication by Controlled Spalling