HOVEL Harold | IBM Thomas J Watson Research Center

スポンサーリンク

概要

• HOVEL Harold J.の詳細を見る
• 同名の論文著者
• IBM Thomas J Watson Research Centerの論文著者

関連著者

• Fogel Keith

  Ibm Thomas J Watson Research Center

• REZNICEK Alexander

  IBM Thomas J Watson Research Center

• BEDELL Stephen

  IBM Thomas J Watson Research Center

• DE SOUZA

  IBM Thomas J Watson Research Center

• SCHWARZ Klaus

  IBM Thomas J Watson Research Center

• OTT John

  IBM Thomas J Watson Research Center

• HOVEL Harold

  IBM Thomas J Watson Research Center

• SADANA Devendra

  IBM Thomas J Watson Research Center

• Ott John

  IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.

• Sadana Devendra

  IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.

• Bedell Stephen

  IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.

もっと見る 閉じる

著作論文

• Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium

スポンサーリンク