Vertical Light-Emitting Diode Fabrication by Controlled Spalling
スポンサーリンク
概要
著者
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Fogel Keith
Ibm Thomas J Watson Research Center
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Lauro Paul
Ibm T. J. Watson Research Center
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Kiser Jonathan
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Bayram Can
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Zhu Yu
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Ott John
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Sadana Devendra
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
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Bedell Stephen
IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.
関連論文
- The Microstructure, Thermal Fatigue, and Failure Analysis of Near-Ternary Eutectic Sn-Ag-Cu Solder Joints
- Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium
- Vertical Light-Emitting Diode Fabrication by Controlled Spalling
- Vertical Light-Emitting Diode Fabrication by Controlled Spalling