Prominent Study on Si Substrate EM Loss and Suppressing Techniques
スポンサーリンク
概要
- 論文の詳細を見る
- 2006-09-13
著者
-
Ye Jing-xiang
Semiconductor Laboratory Dept. Of Applied Physics Chung Cheng Institute Of Technology National Defen
-
Wang Chuan-yu
Semiconductor Laboratory Dept. Of Applied Physics Chung Cheng Institute Of Technology National Defen
-
Kao Chin-hsing
Semiconductor Laboratory Dept. Of Applied Physics Chung Cheng Institute Of Technology National Defen
-
Kao Chin-hsing
Semiconductor Lab. Dept. Of Applied Physics Ccit Ndu
-
LEE Chih-Yuan
Semiconductor Laboratory, Dept. of Applied Physics, Chung Cheng Institute of Technology, National De
-
DENG Joseph
Electric Systems Research Division, Chung-Shang Institute of Science and Technology
-
Lee Chih-yuan
Semiconductor Laboratory Dept. Of Applied Physics Chung Cheng Institute Of Technology National Defen
-
Deng Joseph
Electric Systems Research Division Chung-shang Institute Of Science And Technology
関連論文
- Prominent Study on Si Substrate EM Loss and Suppressing Techniques
- A Novel Triangularity of $Q$-Curve Methodology for Si Inductors Design Automation
- Study of Si Nanostructure in SiO2 layer by Si+ Implantation and Rapid Thermal Annealing