Bit Distribution and Reliability of High Density 1.5V FRAM Embedded with 130nm, 5LM Copper CMOS Logic

スポンサーリンク

概要

論文の詳細を見る
2005-09-13

著者

関連論文

Full-Bit Functional, High-Density 8Mb 1T-1C FRAM Embedded Within a Low-Power 130nm Logic Process
Hydrogen-Robust Submicron IrO_x/PZT/Ir Capacitors for Embedded Ferroelectric Memory
Manufacturable High-Density 8Mb 1T-1C FRAM Embedded Within a Low-Power 130nm Logic Process
Bit Distribution and Reliability of High Density 1.5V FRAM Embedded with 130nm, 5LM Copper CMOS Logic

スポンサーリンク