Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

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概要

• 論文の詳細を見る
• Japan Institute of Metalsの論文
• 2007-06-01

著者

• Aizawa Tatsuhiko

  Department Of Materials Science And Engineering University Of Toronto

• SANTJOJO D.

  Department of Physics, Universitas Brawijaya Malang

• MURAISHI S.

  Department of Materials Science and Technology, Tokyo Institute of Technology

• Santjojo D.

  Department Of Physics Universitas Brawijaya Malang

• Muraishi S.

  Department Of Materials Science And Technology Tokyo Institute Of Technology

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