Proposal of a Technique to Detect Sub-Surface Hot Electrons with a Scanning Probe Microscope
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概要
- 論文の詳細を見る
- 1995-08-21
著者
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Vazquez F.
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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KOBAYASHI D.
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology
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FURUYA K.
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology
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Furuya K.
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
関連論文
- Experimental Evidence of Hot Electron Detection with Scanning Hot Electron Microscopy (SHEM)
- Proposal of a Technique to Detect Sub-Surface Hot Electrons with a Scanning Probe Microscope
- Low leakage gate current of InP transistors with hot electron extracted by attractive potential around i-InP/metal gate
- Influence of impurities on the estimation of the Phase coherent length of electrons in resonant tunneling diodes