Measurement of Hole Transport Parameters in Ultra-Thin SiGe Layers and Their Application in 2D Device Simulations of Heterojunction pMOSFETs
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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DE BOER
Philips Research
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De Boer
Philips Research Laboratories
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Ponomarev Y.
Philips Research Laboratories
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Lander R.
Philips Research Laboratories
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LOO R.
IMEC
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CAYMAX M.
IMEC
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