Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Mahapatra S.
Department ofMicrobiology and Immunology, Kagoshima University Dental School
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Mahapatra S.
Department Of Electrical Engineering Iit Bombay
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Eisele I.
Institute Of Physics University Of German Federal Armed Forces
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Eisele I.
Institute Of Physics Universitat Der Bundeswehr Munich
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RAO V.
Department of Applied Mathematics, Andhra University
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ANIL K.
Institute of Physics, Universitat der Bundeswehr Munich
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Mahapatra S.
Department Of Electrical Engineering Indian Institute Of Technology
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Rao V.
Department Of Electrical Engineering Indian Institute Of Technology
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Rao V.
Department Of Applied Mathematics Andhra University
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