First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM

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概要

• 論文の詳細を見る
• 2005-04-01

著者

• Sawada Hidetaka

  Jeol Ltd.

• Sawada Hidetaka

  Jeol Ltd

• TANAKA Nobuo

  EcoTopia Science Institute, Nagoya University

• YAMASAKI Jun

  EcoTopia Science Institute, Nagoya University

• Yamasaki Jun

  Ecotopia Science Institute Nagoya University

• Tanaka Nobuo

  Ecotopia Science Institute Nagoya University

• Tanaka Nobuo

  Nagoya Univ. Furo‐cho Nagoya Jpn

• TANAKA Nobuo

  EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University

• YAMASAKI Jun

  EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University

関連論文

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• Experimental evaluation of a spherical aberration-corrected TEM and STEM
• Formation and Magnetic Properties of Ultrahigh Density Fe3Si Nanodots Epitaxially Grown on Si(111) Substrates Covered with Ultrathin SiO2 Films
• First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM
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• Three-dimensional STEM for observing nanostructures
• In situ high-resolution transmission electron microscopy of photocatalytic reactions by excited electrons in ionic liquid
• A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM
• Preface to EELS special issue
• Propagation Dynamics of Electron Vortex Pairs
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