Investigation of the Polarization-Induced Charges in Modulation-Doped Al_x- Ga_<1-x>N/ GaN Heterostructures through Capacitance-Voltage Profiling and Simulation
スポンサーリンク
概要
- 論文の詳細を見る
- 2001-09-25
著者
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ARAKAWA Y.
Research Center for Advanced Science and Technology, University of Tokyo
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SHEN B.
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
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ZHANG R.
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
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ZHOU Y.
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
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ZHENG Y.
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
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SOMEYA T.
Research Center for Advanced Science and Technology and Institute of Industrial Science, University
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Shen B.
Jiangsu Provincial Key Laboratory Of Photonic And Electronic Materials Science And Technology And Na
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Zheng Y.
Jiangsu Provincial Key Laboratory Of Photonic And Electronic Materials Science And Technology And Na
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YU H.
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
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Zhang R.
Jiangsu Provincial Key Laboratory Of Photonic And Electronic Materials Science And Technology And Na
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Someya T.
Research Center For Advanced Science And Technology And Institute Of Industrial Science University O
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Arakawa Y.
Research Center For Advanced Science And Technology And Institute Of Industrial Science University O
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Zhou Y.
National Laboratory Of Solid State Microstructures And Department Of Physics Nanjing University
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- Yellow Luminescence in Gallium Nitride Induced by Intentional Impurity Incorporation During Halide Vapor Phase Epitaxy
- High-temperature characteristics of strain in Al_xGa_N/GaN heterostructures
- Investigation of the Polarization-Induced Charges in Modulation-Doped Al_x- Ga_N/ GaN Heterostructures through Capacitance-Voltage Profiling and Simulation
- Photocurrent Properties of AlGaN/GaN/AlGaN Photodetecters on Si
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