Analysis of grain boundaries in CoCrTa and CoPtCrB HDD media by analytical transmission electron microscopy
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概要
- 論文の詳細を見る
- 2005-01-01
著者
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Shoda Kaoru
Ube Scientific Analysis Laboratory Inc.
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MATSUBARA Tohoru
UBE Scientific Analysis Laboratory, Inc.
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TAKEDA Seiji
Osaka University, Graduate School of Science
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Takeda Seiji
Osaka University Graduate School Of Science
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Matsubara Tohoru
Ube Scientific Analysis Laboratory Inc.
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Takeda Seiji
Osaka Univ. Osaka Jpn
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SHODA Kaoru
UBE Scientific Analysis Laboratory, Inc.
関連論文
- In situ Transmission Electron Microscopy Observation of the Graphitization of Silicon Carbide Nanowires Induced by Joule Heating
- Formation of SiC Particles with Projections and a Complex Inner Substructure at the End Stage of Nanowire Growth(Cross-disciplinary physics and related areas of science and technology)
- Analysis of grain boundaries in CoCrTa and CoPtCrB HDD media by analytical transmission electron microscopy
- Transmission Electron Microscopy Investigation of Local Atomic Environment of Nitrogen inside Voids Formed at GaN/Sapphire Interface