Development of an Apertureless Near-Field Optical Microscope for Nanoscale Optical Imaging at Low Temperatures

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概要

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• We have developed an apertureless scanning near-field optical microscope (apertureless SNOM) operating at low temperatures. The apertureless SNOM system is based on the atomic force microscope using a frequency modulation detection technique. The SNOM images reflect local optical properties of the sample surface, and optical images of a ferroelectric material are successfully obtained at low temperatures below a Curie temperature. The SNOM system developed in this work is a powerful tool to image local fields on the sample surface and to study phase transitions under high spatial resolution.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-01-15

著者

• Kanemitsu Yoshihiko

  Graduate School Of Materials Science Nara Institute Of Science And Technology

• Taniguchi Katsuya

  Graduate School Of Materials Science Nara Institute Of Science And Technology

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• Development of an Apertureless Near-Field Optical Microscope for Nanoscale Optical Imaging at Low Temperatures
• Photoluminescence Dynamics of CdS Nanocrystals Fabricated by Sequential Ion Implantation
• Development of Scanning Probe Microscope for Auger Analysis

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