Ion-Induced Secondary Electron Emission Coefficient (γ) from MgO Protective Layer with Microscopic Surface Structures in Alternating Current Plasma Display Panels
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2004-09-15
著者
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Choi Eun
Charged Particle Beam And Plasma Laboratory Department Ofelectrophysics. Kwangwoon University
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Choi Eun
Charged Particle Beam And Plasma Laboratory Department Of Electrophysics/pulse Driven Power Research
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Choi Eun
Charged Particle Beam And Plasma Laboratory/pdp Research Center Department Of Electrophysics Kwangwo
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Oh Jun
Charged Particle Beam And Plasma Laboratory/pdp Research Center Department Of Electrophysics Kwangwo
関連論文
- Leaked Electrons from Virtual Cathode Oscillation
- Measurement of Work Function at MgO Crystal Surface by the γ-Focused Ion Beam System : Nuclear Science, and Chemical Physics
- Characteristic Properties of Fluorescent Lamps Operated Using Capacitively Coupled Electrodes
- Effects of Electrode Length on Capacitively Coupled External Electrode Fluorescent Lamps : Nuclear Science, Plasmas, and Electric Discharges
- Ion-Induced Secondary Electron Emission Coefficient (γ) from MgO Protective Layer with Microscopic Surface Structures in Alternating Current Plasma Display Panels
- Axially Extracted Virtual Cathode Oscillator with Annular Cathode
- Characteristics of Diode Perveance and Output Microwave Power in Coaxial Virtual Cathode Oscillator
- Characteristics of Secondary Electron Emission Coefficient and Sputtering Yield for MgAl2O4/MgO Protective Layer in AC-Plasma Display Panels