Progress in aberration-corrected scanning transmission electron microscopy

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2001-06-01

著者

• NELLIST Peter

  Nion Co.

• Nellist Peter

  Nion R & D

• Lupini Andrew

  Cavendish Laboratory University Of Cambridge

• DELLBY Niklas

  Nion R & D

• KRIVANEK Ondrej

  Nion R & D

• BATSON Philip

  IBM T. J. Watson Research Center

• Krivanek Ondrej

  Nion R & D

• Dellby Niklas

  Nion R & D

関連論文

• HAADF-STEM imaging with sub-angstrom probes : a full Bloch wave analysis
• Progress in aberration-corrected scanning transmission electron microscopy
• Near-edge conduction band electronic states in SiGe alloys

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