HAADF-STEM imaging with sub-angstrom probes : a full Bloch wave analysis

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概要

• 論文の詳細を見る
• 2004-06-01

著者

• Pennycook Stephen

  Condensed Matter Sciences Division Oak Ridge National Laboratory

• PENG Yiping

  Condensed Matter Sciences Division, Oak Ridge National Laboratory

• NELLIST Peter

  Nion Co.

• Peng Yiping

  Condensed Matter Sciences Division Oak Ridge National Laboratory

関連論文

• HAADF-STEM imaging with sub-angstrom probes : a full Bloch wave analysis
• Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope
• Progress in aberration-corrected scanning transmission electron microscopy

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