Near-edge conduction band electronic states in SiGe alloys

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2000-04-01

著者

• BATSON Philip

  IBM T. J. Watson Research Center

• Batson Philip

  Ibm Thomas J. Watson Research Center

関連論文

• Progress in aberration-corrected scanning transmission electron microscopy
• Near-edge conduction band electronic states in SiGe alloys

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