Formulae of Total Electron Yield for Multilayers : Extension of Pepper's Method

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-10-15

著者

• EJIMA Takeo

  Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

• Ejima Takeo

  Institute Of Multidisciplinary Research For Advanced Materials Tohoku University

関連論文

• Surface Segregation of CaF_2 in Thin Si(111)/CaF_2/Si Multilayers Studied by Total Electron Yield Spectroscopy and In situ Ellipsometry
• Formulae of Total Electron Yield for Multilayers : Extension of Pepper's Method
• Surface Segregation of CaF2 in Thin Si(111)/CaF2/Si Multilayers Studied by Total Electron Yield Spectroscopy and In situ Ellipsometry

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