Frequency Stabilization of 421.671nm Second-Harmonic Generation for Studies of <88>^Sr^+ Ions Confined in an RF Trap
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概要
- 論文の詳細を見る
- 2001-10-01
著者
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YODA Jun
National Research Laboratory of Metrology
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HIRANO Iku
National Research Laboratory of Metrology
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Hirano Iku
National Institute Of Advanced Industrial Science And Technology
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Yoda Jun
National Institute Of Advanced Industrial Science And Technology
関連論文
- Storage and Lifetime Measurements of Multiply Charged Ions Produced by Synchrotron Radiation
- Collisional Quenching Rates by He, N_2 and CH_4 for the 4D_ State in SrII
- Determination of Collisional Quenching Rate for the 4D_ State in SrII
- Frequency Stabilization of 421.671nm Second-Harmonic Generation for Studies of ^Sr^+ Ions Confined in an RF Trap
- Resonance of the Macromotion of Ions Trapped in a RF Trap by the Subharmonic Oscillation
- Determination of the Total Number of Ions Confined in an RF Ion Trap
- Measurement of the Storage Time of N_2 Ions Trapped in an RF Ion Trap
- Disappearance of Yb^+ in Excited States from rf Trap by Background Gases
- Spatial Profiles of a Deflected Cesium Atomic Beam
- Determination of Characteristics of Yb^+ Ion Cloud Trapped in a RF Trap with He Buffer Gas
- Construction of an Improved Cesium Frequency Standard (NRLM-II)
- Improvement of the Frequency Stability of the Cs Frequency Standard NRLM-I