Surface Shape Measurement by Phase-Shifting Digital Holography
スポンサーリンク
概要
- 論文の詳細を見る
- 2001-04-01
著者
-
YAMAGUCHI Ichirou
Optical Engineering Laboratory, The Institute of Physical and Chemical Research (RIKEN)
-
Kato Jun-ichi
Optical Engineering Laboratory Riken (the Institute Of Physical And Chemical Research)
-
OHTA Sohgo
Optical Engineering Laboratory, RIKEN (The Institute of Physical and Chemical Research)
-
Yamaguchi Ichirou
Optical Engineering Laboratory Institute Of Physical And Chemical Research (riken)
-
Ohta Sohgo
Optical Engineering Laboratory Riken (the Institute Of Physical And Chemical Research)
関連論文
- Optical Switching of Antiferroelectric Liquid Crystal with Azo-Dye Using Photochemically Induced SmC^*_A-SmC^* Phase Transition
- Measurement and Control of Optically Induced Rotation of Anisotropic Shaped Particles
- Theory for Fringe Locking in a Laser Diode Interferometer
- Polarization Properties in Phase Conjugation with Bacteriorhodopsin
- Real-Time Surface Shape Measurement by an Active Interferometer
- Active Phase-Shifting Interferometer Using Current Modulation of a Laser Diode
- Fringe Locking in a Laser Diode Interferometer by Optical Feedback During Modulation of Injection Current
- Surfase Shape Measurement by Wabelength Scanning Interferometry Using an Electronically Tuned TI : sapphire Laser
- Surface Shape Measurement by Phase-Shifting Digital Holography
- Fringe Locking in a Laser Diode Interferometer under Both Mirror Vibration and Injection Current Modulation
- Surface Reflectivity of Graded-Index Layers Formed by Ion Exchange in Glass
- Field Enhancement by a Metallic Sphere on Dielectric Substrates
- Real-Time Measurement of In-Plane Translation and Tilt by Electronic Speckle Correlation
- Profilometry of Sloped Plane Surfaces by Wavelength Scanning Interferometry
- Phase-Shifting Fringe Analysis for Laser Diode Wavelength-Scanning Interferometer
- Observation of a Fringe Locking Phenomenon in a Self-Feedback Laser Diode Interferometer
- Real-Time Interferometric Spectrometer by Spatial Band-Pass Filtering Detection