Phase-Shifting Fringe Analysis for Laser Diode Wavelength-Scanning Interferometer
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概要
- 論文の詳細を見る
- 2000-04-01
著者
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Kato J
Riken Saitama Jpn
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Kato Jun-ichi
Optical Engineering Laboratory Riken (the Institute Of Physical And Chemical Research)
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Yamaguchi Ichirou
Optical Engineering Laboratory Institute Of Physical And Chemical Research (riken)
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Yamaguchi Ichirou
Optical Engineering Laboratory Riken (the Institute Of Physical And Chemical Research)
関連論文
- Optical Switching of Antiferroelectric Liquid Crystal with Azo-Dye Using Photochemically Induced SmC^*_A-SmC^* Phase Transition
- Measurement and Control of Optically Induced Rotation of Anisotropic Shaped Particles
- Theory for Fringe Locking in a Laser Diode Interferometer
- Polarization Properties in Phase Conjugation with Bacteriorhodopsin
- Real-Time Surface Shape Measurement by an Active Interferometer
- Active Phase-Shifting Interferometer Using Current Modulation of a Laser Diode
- Fringe Locking in a Laser Diode Interferometer by Optical Feedback During Modulation of Injection Current
- Surfase Shape Measurement by Wabelength Scanning Interferometry Using an Electronically Tuned TI : sapphire Laser
- Surface Shape Measurement by Phase-Shifting Digital Holography
- Fringe Locking in a Laser Diode Interferometer under Both Mirror Vibration and Injection Current Modulation
- Surface Reflectivity of Graded-Index Layers Formed by Ion Exchange in Glass
- Field Enhancement by a Metallic Sphere on Dielectric Substrates
- Real-Time Measurement of In-Plane Translation and Tilt by Electronic Speckle Correlation
- Profilometry of Sloped Plane Surfaces by Wavelength Scanning Interferometry
- Phase-Shifting Fringe Analysis for Laser Diode Wavelength-Scanning Interferometer
- Observation of a Fringe Locking Phenomenon in a Self-Feedback Laser Diode Interferometer
- Real-Time Interferometric Spectrometer by Spatial Band-Pass Filtering Detection