Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy
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概要
著者
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KAMATA Satsuo
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering Kagoshima Universit
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Kamata Satsuo
Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering
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HIGO Morihide
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima Universi
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Higo Morihide
Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering Kagoshima University
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HIGO Morihide
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima University
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