Morphological Observation of Tetracyanoquinodimethane Deposited from Solution onto the Atomically Smooth Native Oxide Surface of an Al(111) Film by Atomic Force Microscopy

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概要

• 論文の詳細を見る
• 1999-07-05

著者

• Hipps K.

  Department Of Chemistry Washington State University

• 肥後 盛秀

  鹿児島大学工学部応用化学工学科

• HIGO Morihide

  Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima Universi

• Higo Morihide

  Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering Kagoshima University

• LU X.

  Department of Chemistry, Washington State University

• MAZUR U.

  Department of Chemistry, Washington State University

• HIPPS K.W.

  Department of Chemistry, Washington State University

• Mazur U.

  Department Of Chemistry Washington State University

• 肥後 盛秀

  Dep. Of Chemistry Biotechnology And Chemical Engineering Graduate School Of Sci. And Engineering Kag

• Lu X

  Dalian Inst. Chemical Physics Chinese Acad. Sci. Dalian Chn

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• Tetracyanoquinodimethane Deposited from Solution onto the Atomically Smooth Native Oxide Surface of an Al(111) Film Characterized by X-ray Photoelectron Spectroscopy and Atomic Force Microscopy
• Morphological Observation of Tetracyanoquinodimethane Deposited from Solution onto the Atomically Smooth Native Oxide Surface of an Al(111) Film by Atomic Force Microscopy
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• 訂正 : 非弾性電子トンネル分光法:―電子のトンネル現象を用いる分光法―
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