Calculation of Local Temperature Rise in Focused-Ion-Beam Sample Preparation

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1995-10-01

著者

• Ishitani Tohru

  Instrument Division Hitachi Ltd.

• Ishitani Tohru

  Instrument Division Hitachi Ltd

• KAGA Hiroyasu

  Instrument Division, Hitachi, Ltd.

• Kaga Hiroyasu

  Instrument Division Hitachi Ltd.

• ISHITANI Tohru

  Instrument Division, Hitachi, Ltd.

関連論文

• Focused-Ion-Beam Digging of Biological Specimens
• Monte Carlo Simulation of Ion Bombardment at Low Glancing Angles
• Liquid Metal Ion Sources : Normalization of Virtual Source Size and Angular Ion Intensity
• Calculation of Local Temperature Rise in Focused-Ion-Beam Sample Preparation

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