A Method for Micrometer Resolution Patterning of Primary Culture Neurons for SPM Analysis

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概要

著者

FUJITA H.
LIMMS/ IIS-CNRS, Institute of Industrial Science, University of Tokyo
Tamiya E.
The School Of Materials Science Japan Advanced Institute Of Science And Technology
DEGENAAR P.
The School of Materials Science, Japan Advanced Institute of Science and Technology
PIOUFLE B.
Ecole Normale Superieure de Cachan, Campus de Ker-Lann
GRISCOM L.
LIMMS/CNRS Institute of Industrial Science, University of Tokyo
TIXIER A.
LIMMS/CNRS Institute of Industrial Science, University of Tokyo
AKAGI Y.
The School of Materials Science, Japan Advanced Institute of Science and Technology
MORITA Y.
The School of Materials Science, Japan Advanced Institute of Science and Technology
MURAKAMI Y.
The School of Materials Science, Japan Advanced Institute of Science and Technology
YOKOYAMA K.
The School of Materials Science, Japan Advanced Institute of Science and Technology
Tixier A.
Limms/cnrs Institute Of Industrial Science University Of Tokyo
Griscom L.
Limms/cnrs Institute Of Industrial Science University Of Tokyo
Pioufle B.
Ecole Normale Superieure De Cachan Campus De Ker-lann
Degenaar P.
The School Of Materials Science Japan Advanced Institute Of Science And Technology
Akagi Y
Japan Advanced Inst. Of Sci. And Technol. School Of Materials Sci. Ishikawa
Le Pioufle
Ecole Normale Superieure de Cachan, Campus de Ker-Lann

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