YOKOYAMA K. | The School of Materials Science, Japan Advanced Institute of Science and Technology
スポンサーリンク
概要
関連著者
-
FUJITA H.
LIMMS/ IIS-CNRS, Institute of Industrial Science, University of Tokyo
-
Tamiya E.
The School Of Materials Science Japan Advanced Institute Of Science And Technology
-
AKAGI Y.
The School of Materials Science, Japan Advanced Institute of Science and Technology
-
MORITA Y.
The School of Materials Science, Japan Advanced Institute of Science and Technology
-
MURAKAMI Y.
The School of Materials Science, Japan Advanced Institute of Science and Technology
-
YOKOYAMA K.
The School of Materials Science, Japan Advanced Institute of Science and Technology
-
Tixier A.
Limms/cnrs Institute Of Industrial Science University Of Tokyo
-
Pioufle B.
Ecole Normale Superieure De Cachan Campus De Ker-lann
-
Degenaar P.
The School Of Materials Science Japan Advanced Institute Of Science And Technology
-
DEGENAAR P.
The School of Materials Science, Japan Advanced Institute of Science and Technology
-
PIOUFLE B.
Ecole Normale Superieure de Cachan, Campus de Ker-Lann
-
GRISCOM L.
LIMMS/CNRS Institute of Industrial Science, University of Tokyo
-
TIXIER A.
LIMMS/CNRS Institute of Industrial Science, University of Tokyo
-
Griscom L.
Limms/cnrs Institute Of Industrial Science University Of Tokyo
-
Akagi Y
Japan Advanced Inst. Of Sci. And Technol. School Of Materials Sci. Ishikawa
-
Le Pioufle
Ecole Normale Superieure de Cachan, Campus de Ker-Lann
-
Griscom L.
The School of Materials Science, Japan Advanced Institute of Science and Technology
著作論文
- A Method for Micrometer Resolution Patterning of Primary Culture Neurons for SPM Analysis
- A Method for Micrometer Resolution Patterning of Primary Culture Neurons for SPM Analysis.