Analysis of Atomic Force Curve Data for Mapping of Surface Properties in Water

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2001-03-01

著者

• Sirghi Lucel

  Graduate School Of Engineering Nagoya University

• NAKAGIRI Nobuyuki

  Nikon Corporation

• SUGIMURA Hiroyuki

  Graduate School of Engineering, Nagoya University

• TAKAI Osamu

  Graduate School of Engineering, Nagoya University

関連論文

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• Analysis of Atomic Force Curve Data for Mapping of Surface Properties in Water
• High-Rate Reactive Deposition of SiO_2 Films Using a New DC Rotary Sputtering Cathode
• Effects of Substrate Temperature on Properties of Tin-Doped Indium Oxide Films Deposited by Activated Electron Beam Evaporation
• Analysis of Atomic Force Curve Data for Mapping of Surface Properties in Water

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