Critical Thickness of AlN Thin Film Grown on Al_2O_3(0001)
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-07-15
著者
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Kim Jin
Physical Therapy College Of Rehabilitation Daegu University
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Kim Jin
Physics Department And Research Center For Dielectric And Advanced Matter Physics Pusan National Uni
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Hwang Yoon-hwae
Physics Department And Research Center For Dielectric And Advanced Matter Physics Pusan National Uni
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Kim Hyung
Physics Department And Research Center For Dielectric And Advanced Matter Physics Pusan National Uni
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CHO Jin
Physics Department and Research Center for Dielectric and Advanced Matter Physics Pusan National Uni
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Cho Jin
Physics Department And Research Center For Dielectric And Advanced Matter Physics Pusan National Uni
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- Critical Thickness of AlN Thin Film Grown on Al_2O_3(0001)