Dependence of Fractal Formation on Thickness Ratio and Annealing Time in Au/Ge Bilayer Fims
スポンサーリンク
概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-01
著者
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Hou J
Structure Research Laboratory University Of Science And Technology Of China
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Hou Jianguo
Structure Research Laboratory University Of Science And Technology Of China
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CHEN Zhiwen
Structure Research Laboratory, University of Science and Technology of China
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TAN Shun
Structure Research Laboratory, University of Science and Technology of China
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ZHANG Shuyuan
Structure Research Laboratory, University of Science and Technology of China
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SEKINE Hisashi
Department of Electrical and Electronics Systems Engineering, School of Science and Engineering, Tei
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WU Ziqin
Structure Research Laboratory, University of Science and Technology of China
関連論文
- Size Dependence of Phonon Raman Spectra in Mn_2O_3 Nanocrystals
- Dependence of Fractal Formation on Thickness Ratio and Annealing Time in Au/Ge Bilayer Fims
- Dependence of Fractal Formation on Thickness Ratio and Annealing Time in Au/Ge Bilayer Films