Dependence of Fractal Formation on Thickness Ratio and Annealing Time in Au/Ge Bilayer Films
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概要
- 論文の詳細を見る
The dependence of the fractal formation on the thickness ratio and the annealing time in Au/Ge bilayer films has been investigated by transmission electron microscopy. The experimental evidence indicates that the polycrystalline Ge fractal clusters with various sizes, density, and fractal dimension are formed after crystallization of amorphous Ge. It is found that the fractal formation is sensitively dependent on the thickness ratio of Au and Ge. The random successive nucleation mechanism can be used to explain the behavior of the fractal formation.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-15
著者
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Hou Jianguo
Structure Research Laboratory University Of Science And Technology Of China
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Tan Shun
Structure Research Laboratory University Of Science And Technology Of China
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Wu Ziqin
Structure Research Laboratory University Of Science And Technology Of China
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Chen Zhiwen
Structure Research Laboratory University Of Science And Technology Of China
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Zhang Shuyuan
Structure Research Laboratory University Of Science And Technology Of China
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Sekine Hisashi
Department Of Electrical And Electronics Systems Engineering School Of Science And Engineering Teikyo University
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Wu Ziqin
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026, People's Republic of China
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Hou Jianguo
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026, People's Republic of China
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Tan Shun
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026, People's Republic of China
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Sekine Hisashi
Department of Electrical and Electronics Systems Engineering, School of Science and Engineering, Teikyo University, 1-1 Toyosatodai, Utsunomiya 320, Japan
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