Hou Jianguo | Structure Research Laboratory University Of Science And Technology Of China
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概要
関連著者
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Hou Jianguo
Structure Research Laboratory University Of Science And Technology Of China
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Hou J
Structure Research Laboratory University Of Science And Technology Of China
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CHEN Zhiwen
Structure Research Laboratory, University of Science and Technology of China
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TAN Shun
Structure Research Laboratory, University of Science and Technology of China
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ZHANG Shuyuan
Structure Research Laboratory, University of Science and Technology of China
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SEKINE Hisashi
Department of Electrical and Electronics Systems Engineering, School of Science and Engineering, Tei
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Tan Shun
Structure Research Laboratory University Of Science And Technology Of China
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WU Ziqin
Structure Research Laboratory, University of Science and Technology of China
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Wu Ziqin
Structure Research Laboratory University Of Science And Technology Of China
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Chen Zhiwen
Structure Research Laboratory University Of Science And Technology Of China
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Zhang Shuyuan
Structure Research Laboratory University Of Science And Technology Of China
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Sekine Hisashi
Department Of Electrical And Electronics Systems Engineering School Of Science And Engineering Teikyo University
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Wu Ziqin
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026, People's Republic of China
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Hou Jianguo
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026, People's Republic of China
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Tan Shun
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026, People's Republic of China
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Sekine Hisashi
Department of Electrical and Electronics Systems Engineering, School of Science and Engineering, Teikyo University, 1-1 Toyosatodai, Utsunomiya 320, Japan
著作論文
- Dependence of Fractal Formation on Thickness Ratio and Annealing Time in Au/Ge Bilayer Fims
- Dependence of Fractal Formation on Thickness Ratio and Annealing Time in Au/Ge Bilayer Films