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Toray Research Center, Inc. | 論文
- Isolation of Cytokine Receptor Antagonists from A Helix-loop-helix Peptide Library
- Chemical Structure of Lipid Bioflocculant Produced by Rhodococcus erythropolis
- Formatiom of Self-Assembled Organic Ultrathin film by Chemisorption on Silicon Crystal Surface
- Reduction of Electrical Damage due to Au/Pentacene Contact Formation by Introducing Ar Gas during Au Evaporation
- Structural Study of Intermediate Ions by Kinetic Energy Release and Thermochemical Consideration: [C7H8N]+ Ions from Toluidine Derivatives
- Tandem Mass Spectrometric Studies on the [C_5H_8O_2]^ Ions from Angeric Acid and Tigric Acid Esters
- Tandem Mass Spectrometry of Low Abundance Natural Isotope Peaks A Facile Study of the Fragmentation Pathways
- P27: Technique for Measuring Elastic Modulus of Organic Thin Film with Modified Three-point Bending Test using Composite Beam(SHORT ORAL PRESENTATION FOR POSTERS II)
- Three-Dimensional Elemental Analysis of Commercial 45nm Node Device with High-k/Metal Gate Stack by Atom Probe Tomography
- The systematic study of the microstructure of crosslinked copolymers from siloxane macromonomers and methacrylates by changes in composition and components
- Complete NMR assignment of a sulfonated aromatic block copolymer via heteronuclear single-quantum correlation, heteronuclear multiple-bond correlation and heteronuclear single-quantum correlation total correlation spectroscopy
- Structural Changes of Y2O3 and La2O3 Films by Heat Treatment
- Impact of Thermally Induced Structural Changes on the Electrical Properties of TiN/HfLaSiO Gate Stacks
- Study of Peeling at Doped NiSi/SiO2 Interface
- Three-Dimensional Dopant Characterization of Actual Metal-Oxide-Semiconductor Devices of 65 nm Node by Atom Probe Tomography
- Three-Dimensional Dopant Characterization of Actual Metal-Oxide-Semiconductor Devices of 65nm Node by Atom Probe Tomography