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Tokyo Univ. Agriculture And Technol. Koganei Jpn | 論文
- Surface Transformations in Glass Initiated by Laser-Driven Shock : High Power Ultrasonics
- Explosive Crystallization in Amorphous Silicon Induced by Picosecond High-Power Laser Pulses
- Self-Assmbly of Cyclic Ruthenium Porphyrin Tetramer
- Vertically Linked Ruthenium(II) Porphyrin Oligomers
- Structure Analysis of the Bi_2(Sr,Ca)_3Cu_2O_ Superconducting Crystal Based on the Computer Simulation of HRTEM Images : Condensed Matter
- Twins and Intergrowth Defects in High-T_c Bi-Sr-Ca-Cu-O Superconductor Examined by High-Resolution Electron Microscopy : Electrical Properties of Condensed Matter
- Possible Model of the Modulated Structure in High-T_c Superconductor in a Bi-Sr-Ca-Cu-O System Revealed by High-Resolution Electron Microscopy : Electrical Properties of Condensed Matter
- High-Resolution Electron Microscopy of Modulated Structure in the New High-T_c superconductors of the Bi-Sr-Ca-Cu-O System : Electrical Properties of Condensed Matter
- Pulsed-Laser-Induced Microcrystallization and Amorphization of Silicon Thin Films
- Surface Charge and Adsorption Characteristics of Copper and Zinc on Tropical Peat Soils
- Synthesis of Bi-Sr-Ca-Cu-O Superconductor by Vacuum Calcination Method : Electrical Properties of Condensed Matter
- Synthesis of Superconductive Oxides by Vacuum Calcination Method : Electrical Properties of Condensed Matter
- DETECTION OF ACTIVE OXYGEN GENERATED FROM CERAMIC POWDERS HAVING ANTIBACTERIAL ACTIVITY
- Feasibility Study on High Data Transfer Rate of 300 Mbit / s with 8-Beam Laser Diode Array
- Readout Wave form Equalization in Pulse-Width-Modulated Optical Recording : High Density Recording
- Readout Waveform Equalization in Pulse-Width-Modulated Optical Recording
- Characteristics and issues related to regional-scale modeling of nitrogen flows
- SEM Observation of Ag Crystallites Growing on Graphite Substrate
- Deposition System for SEM "In Situ" Observation of Growing Crystals and the Preliminary Study of Zn Vapor Deposition
- Stress in Pulsed-Laser-Crystallized Silicon Films