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SANYO Semiconductor Co., Ltd. | 論文
- Practical Redundant-Via Insertion Method Considering Manufacturing Variability and Reliability
- A C-Testable 4-2 Adder Tree for an Easily Testable High-Speed Multiplier
- Simple Analytical Formulas for Estimating IR-Drops in an Early Design Stage
- Prevention in a Chip of EMI Noise Caused by X'tal Oscillator