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Research Institute Of Electrical Communication Tohoku University And Crest-japan Science And Technol | 論文
- Spectroscopic Evidence for Energy Loss of Photoelectrons Interacting with Image Charge(Condensed matter: structure and mechanical and thermal properties)
- Scanning Tunneling Microscope Light Emission Mechanism of Pb(Surfaces, Interfaces, and Films)
- Derivative Spectra of Very Low Energy Photoelectrons from CO/Cu(001) Surface Obtained by a Lock-in Technique(Atomic and molecular physics)
- Surface Optical Second Harmonic Generation from Rutile TiO_2(110) in Air
- Comparison of Light-Emission Efficiencies from Si-Metal-Oxide-Semiconductor Junctions and from Si in Scanning Tunneling Microscopy
- Theory of Visible Light Emission from Scanning Tunneling Microscope
- Optical Observation of Single-Electron Charging Effect at Room Temperature
- High Resolution Time-of-Flight Electron Spectrometer
- Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope