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NTT Optoelectronics Laboratories | 論文
- X-Ray Standing Wave Analysis of GaAs/Si Interface
- X-Ray Standing Wave Analysis of Al/GaAs/Si(111)
- Double-Pass Amplification in Ge Soft X-Ray Laser with a Polarizing Half-Cavity
- Generation of Misfit Dislocations in Si_Ge_x/Si Heterostructures
- Dislocation Reduction in MBE-Grown Ge on Si (001) by in situ Thermal Annealing : Condensed Matter
- Misfit Dislocation Structures at MBE-Grown Si_Ge_x/Si Interfaces : Surfaces, Interfaces and Films
- 1.3/1.55-μm Full-Duplex WDM Optical Transceiver Modules for ATM-PON (PDS) Systems Using PLC-Hybrid-Integration and CMOS-IC Technologies (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
- 1.3/1.55-μm Full-Duplex WDM Optical Transceiver Modules for ATM-PON (PDS) Systems Using PLC-Hybrid-Integration and CMOS-IC Technologies (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
- Control of Crystalline Structure and Electrical Properties of TaSiN Thin Film Formed by Reactive RF-Sputtering
- Observation of ultrafast spin-lattice relaxation in Tm2+-doped CaF2 and SrF2 crystals by optical means
- Nitrogen Doped p-Type ZnSe Layer Grown by Metalorganic Vapor Phase Epitaxy : Semiconductors and Semiconductor Devices
- Thermoelastic Strain in ZnSe Films Grown on GaAs by Metalorganic Vapor Phase Epitaxy : Condensed Matter
- Photoluminescence Due to Lattice-Mismatch Defects in High-Purity ZnSe Layers Grown by Metalorganic Vapor Phase Epitaxy : Semiconductors and Semiconductor Devices
- Use of Ethyliodide in Preparation of Low-Resistivity n-Type ZnSe by Metalorganic Vapor Phase Epitaxy : Semiconductors and Semiconductor Devices
- Method of observing the spot where full-power counter-propagating laser pulses collide in plasma media
- Passively Mode-Locked Micromechanically-Tunable Semiconductor Lasers
- Normal Incidence Multilayer Mirrors for Soft X-Rays (光学薄膜特集号)
- Optical Design for Soft X-Ray Projection Lithography : X-Ray Lithography
- Optical Design for Soft X-Ray Projection Lithography
- Nonbolometric Infrared Detection in La_Sr_xCUO_4 and YBa_2Cu_3O_y Epitaxial Thin Films