スポンサーリンク
NTT Basic Research Laboratories, Atsugi, Kanagawa 243-0198, Japan | 論文
- Electromechanical displacement detection with an on-chip high electron mobility transistor amplifier (Special issue: Microprocesses and nanotechnology)
- Removal of Gold Oxide by Low-Temperature Hydrogen Annealing for Microelectromechanical System Device Fabrication
- Direct Actuation of GaAs Membrane with the Microprobe of Scanning Probe Microscopy
- Stiffness of Step Bunches on Si(111)