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Kyushu Electronic Metal Corp. | 論文
- Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface
- Electrochemical Array(ECA)as an Integrated Multi-electrode DNA Sensor (特集:マイクロ化学分析システム)
- A Method of Quantitative Contamination with Metallic Impurities of the Surface of a Silicon Wafer : Semiconductors and Semiconductor Devices
- Influence of Metal Impurities on Leakage Current of Si N^+ P Diode
- Comparison of Gettering Techniques by Means of Intentional Quantitative Cu Contamination : Electrical Properties of Condensed Matter
- A Model of Thermal Transfer in Czochralski Silicon Molten