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Key Laboratory Of Computer System And Architecture Institute Of Computing Technology Chinese Academy Of Sciences | 論文
- Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time(Dependable Computing)
- Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores(Dependable Computing)
- A New Multiple-Round Dimension-Order Routing for Networks-on-Chip