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Jusung Engineering Co. Ltd. | 論文
- Physical Properties of Highly Conformal TiN Thin films Grown by Atomic Layer Deposition
- Effect of Structural Properties on Electrical Properties of Lanthanum Oxide Thin Film as a Gate Dielectric
- Effect of Structural Properties on Electrical Properties of Lanthanum Oxide Thin Film as a Gate Dielectric
- Physical Properties of Highly Conformal TiN Thin films Grown by Atomic Layer Deposition