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JEOL Ltd. | 論文
- Little Influence of Kinks on the Formation of c(4×2)Domains in a Si(001)Surface at Low Temperature
- Measurement of Terrace Width Distribution on an Si(110) Surface Using High-Temperature Scanning Tunneling Microscopy
- Scanning Tunneling Microscopy Observation of Ar-Ion-Bombarded Si(001) Surfaces and Regrowth Processes by Thermal Annealing
- Adsorption of Bismuth on Si(110) Surfaces Studied by Scanning Tunneling Microscopy
- Dynamic Observation of Ag Desorptiom Process onm Si(111) Surface by High-Termperature Scanning Tunneling Mieroscopy
- High-Temperature Scanning Tunneling Microscopy Observation of a (15, 17, 1) Facet Structure on a Si(110) Surface
- High-Temperature Scanning Tunneling Microscopy Study of the Phase Transition of 16-Structure Appearing on a Si(110) Surface
- Formation of Icosahedral Quasicrystalline Phase in Zr-Al-Ni-Cu-M (M=Ag, Pd, Au or Pt) Systems
- 29aB01 ヘリカル系プラズマ3次元平衡における磁気島の解析 : HINTコードの拡充(ヘリカルI)
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- 200 kV Mass-Separated Fine Focused Ion Beam Apparatus
- PREPARATION OF SEM SPECIMENS BY ION BEAM ETCHING FOR ENHANCED CHANNELING AND ORIENTATION IMAGING
- REACTIVE ION BEAM ETCHING (RIBE) TECHNIQUE FOR CROSS SECTIONAL SEM SPECIMEN PREPARATION OF SEMICONDUCTORS
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- 27pXG-11 Long Time Scale Evolution of Collisionless Driven Reconnection in a 2D Open System
- 地球シミュレータと未来科学
- 地球と人類の未来を設計する地球シミュレータ(大きなもの)
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